Near-field scanning optical microscopy with nanometer-sized light emitting diode

Researchers from the University of Texas at Austin have shed new light on near-field scanning optical microscopy. Incorporating a nanometer-scale LED in the probe tip of an atomic force microscope, they acquired optical and topographic images of a test pattern at a resolution of 400 and 50 nm, respectively. It is, they say, the first time that apertureless images have been acquired with a light source embedded in a scanning probe tip.

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